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³Ô¹ÏºÚÁÏ Presents at International Test Conference?

International Test Conference is the world¡¯s premier venue dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

³Ô¹ÏºÚÁÏ Presentation

Title: A Novel Test Data Compaction Method with Improved Debug Capabilities of the Signatures
Date: July 24, 2023
Time: 11:30 am ¨C 1:00 pm
³Ô¹ÏºÚÁÏ Presenters: Jaidev Shenoy, Kelly Ockunzzi and Dr. Virendra Singh

Title: Poster ¨C ¡°Divide And Conquer the Scan World of Mammoth SoCs with Novel Pattern Porting Approach¡±
Date: July 24, 2023
Time: 4:00 - 5:30 pm
³Ô¹ÏºÚÁÏ Presenters: Akhtar Tamboli, Mayur Gavali, Pradeep Nagalapura and Bharat Londhe