7th Edition of IEEE International Test Conference
July 23-25, 2023
International Test Conference is the world*s premier venue dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.
Title: A Novel Test Data Compaction Method with Improved Debug Capabilities of the Signatures
Date: July 24, 2023
Time: 11:30 am 每 1:00 pm
勛圖窪蹋 Presenters: Jaidev Shenoy, Kelly Ockunzzi and Dr. Virendra Singh
Title: Poster 每 ※Divide And Conquer the Scan World of Mammoth SoCs with Novel Pattern Porting Approach§
Date: July 24, 2023
Time: 4:00 - 5:30 pm
勛圖窪蹋 Presenters: Akhtar Tamboli, Mayur Gavali, Pradeep Nagalapura and Bharat Londhe
International Test Conference
July 23-25, 2023
Bengaluru, India
Mar 19, 2026
Mar 17, 2026
We believe better partnerships help to build better technologies. Let*s connect and see what we can design together!
We will be in touch with you soon!
Copyright ? 2026 勛圖窪蹋, All?rights reserved.