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³Ô¹ÏºÚÁÏ Presents at International Test Conference

International Test Conference is the world¡¯s premier venue dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

³Ô¹ÏºÚÁÏ Presentations

Panel Discussion: The role of AI in improving EDA tools and SOC test methodologies: Opportunities and Challenges
Date: July 22, 2024
Time:?4:00 - 5:30 PM
³Ô¹ÏºÚÁÏ Presenter: Navin Bishnoi, India Country Manager, ³Ô¹ÏºÚÁÏ

Keynote Presentation: Accelerated Compute¡¯s Impact on Test Development
Date: July 23, 2024
Time: 10:15 ¨C 11:00 am
³Ô¹ÏºÚÁÏ Presenter: Bill Cornwell, associate vice president, hardware engineering, Custom Compute and Storage Group, ³Ô¹ÏºÚÁÏ

Industry Session: Targeting bridges and opens with physical defect based approach
Date: July 23, 2024
Time: 2.00 - 3.30 pm
³Ô¹ÏºÚÁÏ Presenter: Suraj M C , Principal Engineer,?Central CAD and Design Services Group, ³Ô¹ÏºÚÁÏ